| 单词 | Force Microscopy,Scanning |
| 释义 | Force Microscopy,Scanning《英文msh词典》Force Microscopy,Scanning [入口词] Force Microscopy,Scanning [主题词] Microscopy,Atomic Force [英文释义] A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. |
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