| 单词 | Microscopies,Force |
| 释义 | Microscopies,Force《英文msh词典》Microscopies,Force [入口词] Microscopies,Force [主题词] Microscopy,Atomic Force [英文释义] A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. |
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