《英文msh词典》Microscopies,Scanning Force
[入口词] Microscopies,Scanning Force
[主题词] Microscopy,Atomic Force
[英文释义] A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.